由网友(给脸你得要)分享简介：下面的问题：我有许多不同厚度的痕迹组成的二进制图像。下面有两个图像来说明这个问题：Here's the problem: I have a number of binary images composed by traces of different thickness. Below there are two im...

下面的问题：我有许多不同厚度的痕迹组成的二进制图像。下面有两个图像来说明这个问题：

Here's the problem: I have a number of binary images composed by traces of different thickness. Below there are two images to illustrate the problem:

我需要的是测量中的图像痕迹的平均厚度（以像素为单位）。事实上，迹线中的图像的平均厚度是有些主观的量度。所以，我需要的是具有与跟踪半径一定的相关性，如下图所示的措施：

What I need is to measure the average thickness (in pixels) of the traces in the images. In fact, the average thickness of traces in an image is a somewhat subjective measure. So, what I need is a measure that have some correlation with the radius of the trace, as indicated in the figure below:

由于该措施并不需要非常precise，我很愿意交易precision速度。换句话说，速度是这个问题的解决方案的一个重要的因素。

Since the measure doesn't need to be very precise, I am willing to trade precision for speed. In other words, speed is an important factor to the solution of this problem.

有可能是在走线的交叉点。

There might be intersections in the traces.

跟踪厚度可能不是恒定的，而是一个普通的措施是正常（甚至是最高跟踪厚度是可以接受的）。

The trace thickness might not be constant, but an average measure is OK (even the maximum trace thickness is acceptable).

跟踪总是会远远长于它的宽度。

The trace will always be much longer than it is wide.

推荐答案

我建议这个算法：

应用一个距离变换到图像，使得所有的背景像素被设置为0，所有的前景像素从背景设置到距离 找到中距离变换的图像局部最大值。这些是在各行的中间点。把自己的像素值的图像（在后台即距离）成一个列表 在计算该列表的中值或平均值